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diff --git a/src/vendorcode/amd/agesa/f10/Proc/Mem/Tech/mttml.c b/src/vendorcode/amd/agesa/f10/Proc/Mem/Tech/mttml.c
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+/**
+ * @file
+ *
+ * mttml.c
+ *
+ * Technology Max Latency Training support
+ *
+ * @xrefitem bom "File Content Label" "Release Content"
+ * @e project: AGESA
+ * @e sub-project: (Mem/Tech)
+ * @e \$Revision: 44323 $ @e \$Date: 2010-12-22 01:24:58 -0700 (Wed, 22 Dec 2010) $
+ *
+ **/
+/*****************************************************************************
+*
+* Copyright (c) 2011, Advanced Micro Devices, Inc.
+* All rights reserved.
+*
+* Redistribution and use in source and binary forms, with or without
+* modification, are permitted provided that the following conditions are met:
+* * Redistributions of source code must retain the above copyright
+* notice, this list of conditions and the following disclaimer.
+* * Redistributions in binary form must reproduce the above copyright
+* notice, this list of conditions and the following disclaimer in the
+* documentation and/or other materials provided with the distribution.
+* * Neither the name of Advanced Micro Devices, Inc. nor the names of
+* its contributors may be used to endorse or promote products derived
+* from this software without specific prior written permission.
+*
+* THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS" AND
+* ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
+* WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
+* DISCLAIMED. IN NO EVENT SHALL ADVANCED MICRO DEVICES, INC. BE LIABLE FOR ANY
+* DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
+* (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES;
+* LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND
+* ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT
+* (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS
+* SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
+*
+* ***************************************************************************
+*
+*/
+
+/*
+ *----------------------------------------------------------------------------
+ * MODULES USED
+ *
+ *----------------------------------------------------------------------------
+ */
+
+
+
+#include "AGESA.h"
+#include "Ids.h"
+#include "mm.h"
+#include "mn.h"
+#include "mu.h"
+#include "mt.h"
+#include "merrhdl.h"
+#include "GeneralServices.h"
+#include "Filecode.h"
+#define FILECODE PROC_MEM_TECH_MTTML_FILECODE
+/*----------------------------------------------------------------------------
+ * DEFINITIONS AND MACROS
+ *
+ *----------------------------------------------------------------------------
+ */
+
+/*----------------------------------------------------------------------------
+ * TYPEDEFS AND STRUCTURES
+ *
+ *----------------------------------------------------------------------------
+ */
+
+/*----------------------------------------------------------------------------
+ * PROTOTYPES OF LOCAL FUNCTIONS
+ *
+ *----------------------------------------------------------------------------
+ */
+
+/*----------------------------------------------------------------------------
+ * EXPORTED FUNCTIONS
+ *
+ *----------------------------------------------------------------------------
+ */
+/* -----------------------------------------------------------------------------*/
+/**
+ *
+ * This function trains Max latency for all dies
+ *
+ * @param[in,out] *TechPtr - Pointer to the MEM_TECH_BLOCK
+ *
+ * @return TRUE - No fatal error occurs.
+ * @return FALSE - Fatal error occurs.
+ */
+
+BOOLEAN
+MemTTrainMaxLatency (
+ IN OUT MEM_TECH_BLOCK *TechPtr
+ )
+{
+ UINT32 TestAddrRJ16;
+ UINT8 Dct;
+ UINT8 ChipSel;
+ _16BYTE_ALIGN UINT8 PatternBuffer[6 * 64];
+ UINT8 TestBuffer[6 * 64];
+ UINT8 *PatternBufPtr;
+ UINT16 MaxLatDly;
+ UINT16 MaxLatLimit;
+ UINT16 Margin;
+ UINT16 CurTest;
+ UINT8 _CL_;
+ UINT8 TimesFail;
+ UINT8 TimesRetrain;
+
+ MEM_DATA_STRUCT *MemPtr;
+ DIE_STRUCT *MCTPtr;
+ MEM_NB_BLOCK *NBPtr;
+
+ NBPtr = TechPtr->NBPtr;
+ MCTPtr = NBPtr->MCTPtr;
+ MemPtr = NBPtr->MemPtr;
+ TimesRetrain = DEFAULT_TRAINING_TIMES;
+ IDS_OPTION_HOOK (IDS_MEM_RETRAIN_TIMES, &TimesRetrain, &MemPtr->StdHeader);
+
+ IDS_HDT_CONSOLE ("!\nStart MaxRdLat training\n");
+ // Set environment settings before training
+ AGESA_TESTPOINT (TpProcMemMaxRdLatencyTraining, &(MemPtr->StdHeader));
+ MemTBeginTraining (TechPtr);
+
+ _CL_ = (MCTPtr->Status[Sb128bitmode]) ? 6 : 3;
+ PatternBufPtr = PatternBuffer;
+ MemUFillTrainPattern (TestPatternML, PatternBufPtr, _CL_ * 64);
+
+ // Begin max latency training
+ for (Dct = 0; Dct < NBPtr->DctCount; Dct++) {
+ if (MCTPtr->Status[Sb128bitmode] && (Dct != 0)) {
+ break;
+ }
+
+ IDS_HDT_CONSOLE ("!\tDct %d\n", Dct);
+ NBPtr->SwitchDCT (NBPtr, Dct);
+
+ if (NBPtr->DCTPtr->Timings.DctMemSize != 0) {
+ if (TechPtr->FindMaxDlyForMaxRdLat (TechPtr, &ChipSel)) {
+
+ if (NBPtr->GetSysAddr (NBPtr, ChipSel, &TestAddrRJ16)) {
+ IDS_HDT_CONSOLE ("!\t\tCS %d\n", ChipSel);
+ IDS_HDT_CONSOLE ("\t\t\tWrite to address: %04lx0000\n", TestAddrRJ16);
+
+ // Write the test patterns
+ AGESA_TESTPOINT (TpProcMemMaxRdLatWritePattern, &(MemPtr->StdHeader));
+ NBPtr->WritePattern (NBPtr, TestAddrRJ16, PatternBufPtr, _CL_);
+
+ // Sweep max latency delays
+ NBPtr->getMaxLatParams (NBPtr, TechPtr->MaxDlyForMaxRdLat, &MaxLatDly, &MaxLatLimit, &Margin);
+ AGESA_TESTPOINT (TpProcMemMaxRdLatStartSweep, &(MemPtr->StdHeader));
+
+ TimesFail = 0;
+ ERROR_HANDLE_RETRAIN_BEGIN (TimesFail, TimesRetrain)
+ {
+ for (; MaxLatDly < MaxLatLimit; MaxLatDly++) {
+ NBPtr->SetBitField (NBPtr, BFMaxLatency, MaxLatDly);
+ IDS_HDT_CONSOLE ("\t\t\tDly %3x", MaxLatDly);
+ TechPtr->ResetDCTWrPtr (TechPtr, 6);
+
+ AGESA_TESTPOINT (TpProcMemMaxRdLatReadPattern, &(MemPtr->StdHeader));
+ NBPtr->ReadPattern (NBPtr, TestBuffer, TestAddrRJ16, _CL_);
+ AGESA_TESTPOINT (TpProcMemMaxRdLatTestPattern, &(MemPtr->StdHeader));
+ CurTest = NBPtr->CompareTestPattern (NBPtr, TestBuffer, PatternBufPtr, _CL_ * 64);
+ NBPtr->FlushPattern (NBPtr, TestAddrRJ16, _CL_);
+
+ // Traditional training increments MaxLatDly until the test passes
+ // and uses it as left edge
+ if (CurTest == 0xFFFF) {
+ IDS_HDT_CONSOLE (" P");
+ IDS_HDT_CONSOLE ("\n");
+ break;
+ } else {
+ MaxLatDly++;
+ }
+ IDS_HDT_CONSOLE ("\n");
+ }// End of delay sweep
+ ERROR_HANDLE_RETRAIN_END ((MaxLatDly >= MaxLatLimit), TimesFail)
+ }
+
+ AGESA_TESTPOINT (TpProcMemMaxRdLatSetDelay, &(MemPtr->StdHeader));
+
+ if (MaxLatDly >= MaxLatLimit) {
+ PutEventLog (AGESA_ERROR, MEM_ERROR_MAX_LAT_NO_WINDOW, NBPtr->Node, NBPtr->Dct, NBPtr->Channel, 0, &NBPtr->MemPtr->StdHeader);
+ SetMemError (AGESA_ERROR, MCTPtr);
+ NBPtr->DCTPtr->Timings.CsTrainFail |= NBPtr->DCTPtr->Timings.CsPresent;
+ MCTPtr->ChannelTrainFail |= (UINT32)1 << Dct;
+ if (!NBPtr->MemPtr->ErrorHandling (MCTPtr, NBPtr->Dct, EXCLUDE_ALL_CHIPSEL, &NBPtr->MemPtr->StdHeader)) {
+ return FALSE;
+ }
+ } else {
+ // set final delays
+ NBPtr->SetBitField (NBPtr, BFMaxLatency, MaxLatDly + Margin);
+ }
+ }
+ }
+ }
+ }
+
+ // Restore environment settings after training
+ MemTEndTraining (TechPtr);
+ IDS_HDT_CONSOLE ("End MaxRdLat training\n\n");
+ return (BOOLEAN) (MCTPtr->ErrCode < AGESA_FATAL);
+}
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